Cart (0)
  • No items in cart.
Total
$0
There is a technical issue about last added item. You can click "Report to us" button to let us know and we resolve the issue and return back to you or you can continue without last item via click to continue button.
Home
Content
Tour
eLibrary
Store
Search book title
Enter keywords for book title search
Search book content
Enter keywords for book content search
Filters:
FORMAT
BOOKS
All Books
PACKAGES
All Packages
EDITION
to
PUBLISHER
AABC
(1)
AAMI
(317)
ACI
(572)
AISC
(43)
ASA
(234)
ASCE
(969)
ASHRAE
(643)
ASME
(2114)
ASSE
(64)
ASTM
(92448)
AWC
(54)
AWWA
(535)
BHMA
(117)
BICSI
(31)
BIFMA
(20)
BOMA
(19)
BSI
(92811)
CHD
(3)
CRSI
(17)
IAHSS
(1)
IAPMO
(351)
ICC
(300)
IEEE
(6023)
IES
(239)
ISEA
(16)
Joint Commission
(177)
Joint Commission Int.
(1)
NETA
(5)
NFPA
(1621)
TCNA
(16)
TMS
(18)
USGBC
(28)
WILEY
(4)
 
AR
(6)
AZ
(7)
CA
(115)
CT
(3)
FL
(57)
ID
(5)
IL
(5)
IN
(1)
KY
(1)
LA
(2)
MI
(23)
MN
(26)
NC
(27)
NJ
(13)
NY
(61)
OH
(24)
OR
(22)
PA
(7)
RI
(8)
SC
(20)
SD
(1)
TX
(3)
VA
(50)
VT
(6)
WA
(31)
CONTENT TYPE
 Act
 Admin Code
 Announcements
 Bill
 Book
 CADD File
 CAN
 CEU
 Charter
 Checklist
 City Code
 Code
 Commentary
 Comprehensive Plan
 Conference Paper
 County Code
 Course
 DHS Documents
 Document
 Errata
 Executive Regulation
 Federal Guideline
 Firm Content
 Guideline
 Handbook
 Interpretation
 Journal
 Land Use and Development
 Law
 Legislative Rule
 Local Amendment
 Local Code
 Local Document
 Local Regulation
 Local Standards
 Manual
 Model Code
 Model Standard
 Notice
 Ordinance
 Other
 Paperback
 PASS
 Periodicals
 PIN
 Plan
 Policy
 Product
 Program
 Provisions
 Requirements
 Revisions
 Rules & Regulations
 Standards
 State Amendment
 State Code
 State Manual
 State Plan
 State Standards
 Statute
 Study Guide
 Supplement
 Technical Bulletin
 All
  • BSI
    PD IEC/TR 61967-1-1:2015 Integrated circuits. Measurement of electromagnetic emissions - General conditions and definitions. Near-field scan data exchange format
    Edition: 2015
    $497.46
    / user per year

Description of PD IEC/TR 61967-1-1:2015 2015

This part of IEC 61967 provides guidance for exchanging data generated by near-field scan measurements.

The described exchange format could also be used for near-field scan data generated by simulation or computation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission and immunity near-field scan data in the frequency and time domains.

The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein.



Standard NumberPD IEC/TR 61967-1-1:2015
TitleIntegrated circuits. Measurement of electromagnetic emissions - General conditions and definitions. Near-field scan data exchange format
StatusDefinitive
Publication Date2015-09-30
ReplacesPD IEC/TR 61967-1-1:2010
Identical National Standard OfIEC TR 61967-1-1:2015
DescriptorsRadio disturbances, Integrated circuits, Electromagnetic fields, Data representation, Circuits, Emission, Electronic equipment and components, Information exchange, Noise (spurious signals), XML, Electrical measurement, Data transfer, Data processing, Electromagnetic radiation
ICS31.200 Integrated circuits. Microelectronics
CommitteeEPL/47
ISBN978 0 580 86204 5
PublisherBSI
Pages68

About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
GROUPS
X