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  • BSI
    BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
    Edition: 2013
    $316.70
    / user per year

Description of BS ISO 11938:2012 2013

This International Standard provides procedures for electron microprobe elemental-mapping analysis using wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is assessed. It describes five types of data processing: the raw X-ray intensity data method, the k-value method, the calibration method, the correlation method and the matrix correction method.



Standard NumberBS ISO 11938:2012
TitleMicrobeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
StatusConfirmed
Publication Date2013-04-30
Identical National Standard OfISO 11938:2012
DescriptorsSpectroscopy, X-ray fluorescence spectrometry, Semiconductor diodes, Chemical analysis and testing, Semiconductors, Detectors, Electron beams
ICS71.040.50 Physicochemical methods of analysis
CommitteeCII/9
ISBN978 0 580 63714 8
PublisherBSI
Pages22

About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
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