Cart (0)
  • No items in cart.
Total
$0
There is a technical issue about last added item. You can click "Report to us" button to let us know and we resolve the issue and return back to you or you can continue without last item via click to continue button.
Home
Content
Tour
eLibrary
Store
Search book title
Enter keywords for book title search
Search book content
Enter keywords for book content search
Filters:
FORMAT
BOOKS
All Books
PACKAGES
All Packages
EDITION
to
PUBLISHER
AABC
(1)
AAMI
(317)
ACI
(572)
AISC
(44)
ASA
(234)
ASCE
(969)
ASHRAE
(649)
ASME
(2114)
ASSE
(64)
ASTM
(92448)
AWC
(54)
AWWA
(535)
BHMA
(117)
BICSI
(33)
BIFMA
(20)
BOMA
(19)
BSI
(92811)
CHD
(3)
CRSI
(17)
IAHSS
(1)
IAPMO
(351)
ICC
(300)
IEEE
(6217)
IES
(239)
ISEA
(16)
Joint Commission
(177)
Joint Commission Int.
(1)
NETA
(5)
NFPA
(1621)
TCNA
(16)
TMS
(18)
USGBC
(28)
WILEY
(4)
 
AR
(6)
AZ
(7)
CA
(115)
CT
(3)
FL
(57)
ID
(5)
IL
(5)
IN
(1)
KY
(1)
LA
(2)
MI
(23)
MN
(26)
NC
(27)
NJ
(13)
NY
(61)
OH
(24)
OR
(22)
PA
(7)
RI
(8)
SC
(20)
SD
(1)
TX
(3)
VA
(50)
VT
(6)
WA
(31)
CONTENT TYPE
 Act
 Admin Code
 Announcements
 Bill
 Book
 CADD File
 CAN
 CEU
 Charter
 Checklist
 City Code
 Code
 Commentary
 Comprehensive Plan
 Conference Paper
 County Code
 Course
 DHS Documents
 Document
 Errata
 Executive Regulation
 Federal Guideline
 Firm Content
 Guideline
 Handbook
 Interpretation
 Journal
 Land Use and Development
 Law
 Legislative Rule
 Local Amendment
 Local Code
 Local Document
 Local Regulation
 Local Standards
 Manual
 Model Code
 Model Standard
 Notice
 Ordinance
 Other
 Paperback
 PASS
 Periodicals
 PIN
 Plan
 Policy
 Product
 Program
 Provisions
 Requirements
 Revisions
 Rules & Regulations
 Standards
 State Amendment
 State Code
 State Manual
 State Plan
 State Standards
 Statute
 Study Guide
 Supplement
 Technical Bulletin
 All
  • BSI
    BS EN 62979:2017 Photovoltaic modules. Bypass diode. Thermal runaway test (IEC 2979:2017)
    Edition: 2017
    $316.70
    / user per year

Description of BS EN 62979:2017 2017

This document provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating.

This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.

The test specimens which employ P/N diodes as bypass diodes are exempted from the thermal runaway test required herein, because the capability of P/N diodes to withstand the reverse bias is sufficiently high.



Standard NumberBS EN 62979:2017
TitlePhotovoltaic modules. Bypass diode. Thermal runaway test (IEC 2979:2017)
StatusDefinitive
Publication Date2017-12-14
Identical National Standard OfIEC 62979:2017, EN 62979:2017, EN 61000-4-14:1999/A2:2009
DescriptorsModules, Photovoltaic cells, Loading, Cyclic loading, Periodicity, Solar cells, Variable, Photoelectric cells, Cyclic
ICS27.160 Solar energy engineering
CommitteeGEL/82
ISBN978 0 580 91892 6
PublisherBSI
Pages20

About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
GROUPS
X