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IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments, 2007
- CONTENTS
- FOREWORD
- Title page
- IEEE Introduction [Go to Page]
- Notice to users
- Participants
- 1. Overview [Go to Page]
- 1.1 Scope
- 1.2 Purpose
- 2. Definitions, acronyms, and abbreviations [Go to Page]
- 2.1 Definitions
- 2.2 Acronyms and abbreviations
- 3. Structure of this standard
- 4. STIL syntax description [Go to Page]
- 4.1 Reserved words
- 4.2 Reserved characters
- 4.3 Reserved UserFunctions
- 4.4 Signal and group name characteristics
- 4.5 STIL name spaces and name resolution
- 5. Expressions [Go to Page]
- 5.1 Constant and variable expressions
- 5.2 Expression delimiters—single quotes and parentheses
- 5.3 Arithmetic expressions—integer, real, time, boolean
- 5.4 Pattern data expressions
- 5.5 Expression processing
- 5.6 Boolean—boolean_expr
- 5.7 Integers—integer_expr
- 5.8 Logic expressions—logic_expr
- 5.9 Real expressions—real_expr
- 5.10 Addition to timing expressions—time_expr
- 5.11 SignalVariables—sigvar_expr
- 5.12 Formal parameters in procedures and macros
- 5.13 Integer lists—integer_list
- 6. Statement structure and organization of STIL information
- 7. STIL statement [Go to Page]
- 7.1 STIL syntax
- 7.2 STIL example
- 8. UserKeywords statement [Go to Page]
- 8.1 UserKeywords syntax
- 8.2 UserKeywords example
- 9. Variables block [Go to Page]
- 9.1 Variables block syntax
- 9.2 Variables example
- 9.3 Variables scoping
- 9.4 Variables synchronizing
- 10. Signals block [Go to Page]
- 10.1 Signals block syntax
- 10.2 Signals example
- 10.3 Bracketed signal notation enhancement
- 11. SignalGroups block [Go to Page]
- 11.1 SignalGroups syntax
- 11.2 SignalGroups, WFCMap, and Variables example
- 11.3 Default WFCMap attribute value
- 11.4 Defining indexed signal groups
- 12. PatternBurst block [Go to Page]
- 12.1 PatternBurst syntax
- 12.2 PatternBurst example
- 12.3 Tiling and synchronization of patterns
- 12.4 If and While statements
- 13. Timing block and WaveformTable block [Go to Page]
- 13.1 Additional domain specification
- 13.2 CompareSubstitute operation—s, S
- 14. ScanStructures block [Go to Page]
- 14.1 ScanStructures syntax
- 14.2 Scan cell naming—cell_ref, chain_ref, cell_group, chain_group
- 14.3 Scoping rules for ScanStructure blocks
- 14.4 Example indexed list of scan cells
- 14.5 Example of ScanChainGroups and ActiveScanChain
- 14.6 Scan chain segments and cell groups
- 15. Pattern data [Go to Page]
- 15.1 Data content read back—\C, \D, \E, \S, \U, \W
- 15.2 Vector data mapping and joining—\m, \j
- 15.3 Specifying event data in a pattern—\e
- 15.4 Using expressions within pattern data
- 16. Pattern statements [Go to Page]
- 16.1 Additional Pattern syntax
- 16.2 Vector data constraints—F, E
- 16.3 Shift and LoopData statements
- 16.4 Loop statement using an integer expression
- 16.5 MergedScan function
- 17. Procedure and macro data substitution [Go to Page]
- 17.1 Nested procedure and macro cells
- 17.2 Passing parameters to variables
- 17.3 Default value of formal parameters
- 17.4 Data substitution using WFCConstant and SignalVariable
- 18. Environment block [Go to Page]
- 18.1 Environment syntax
- 18.2 MAP_STRING syntax
- 18.3 NameMaps example
- 18.4 Compact scan-cell mapping using InheritNameMap
- 19. Pragma block [Go to Page]
- 19.1 Pragma syntax
- 20. PatternFailReport [Go to Page]
- 20.1 PatternFailReport syntax
- 20.2 PatternFailReport example
- Annex A (informative) Glossary
- Annex B (informative) Signal mapping using SignalVariables
- Annex C (informative) Using logic expression with signals
- Annex D (informative) Using boolean expressions in patterns
- Annex E (informative) Variables and expressions in algorithmic patterns
- Annex F (informative) Using AllowInterleave
- Annex G (informative) Vector data mapping using \m
- Annex H (informative) Vector data joining using \j
- Annex I (informative) Block data collection
- Annex J (informative) Using Fixed and Equivalent statements
- Annex K (informative) Independent parallel patterns
- Annex L (informative) Applications using new ScanStructures syntax
- Annex M (informative) BreakPoints using MergedScan() function
- Annex N (informative) Labels and X statements for diagnostic feedback
- Annex O (informative) Use of STIL.1 for specific applications
- Annex P (informative) Bibliography
- Annex Q (informative) List of participants [Go to Page]