ASTM E431-96(2007)
Historical Standard: ASTM E431-96(2007) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
SUPERSEDED (see Active link, below)
ASTM E431
1. Scope
1.1 This guide provides illustrations of radiographs of semiconductors and related devices. Low powered transistors (through the TO-11 case configuration), diodes, low-power rectifiers, power devices, and integrated circuits are illustrated with common assembly features. Particular areas of construction are featured for these devices detailing critical points of design or assembly.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
ASTM Standards
E801 Practice for Controlling Quality of Radiological Examination of Electronic Devices
E1161 Practice for Radiologic Examination of Semiconductors and Electronic Components
E1255 Practice for Radioscopy
E1316 Terminology for Nondestructive Examinations
Keywords
electronic devices; nondestructive testing; radiographs; radiography; reference illustrations; semiconductors; x-ray;
ICS Code
ICS Number Code 31.080.01 (Semi-conductor devices in general)
DOI: 10.1520/E0431-96R07
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