1. Scope

1.1 This practice sets forth requirements to ensure consistency in neutron-induced displacement damage testing of silicon and gallium arsenide electronic piece parts. This requires controls on facility, dosimetry, tester, and communications processes that affect the accuracy and reproducibility of these tests. It provides background information on the technical basis for the requirements and additional recommendations on neutron testing. In addition to neutrons, reactors are used to provide gamma-ray pulses of intensities and durations that are not achievable elsewhere. This practice also provides background information and recommendations on gamma-ray testing of electronics using nuclear reactors.

1.2 Methods are presented for ensuring and validating consistency in neutron displacement damage testing of electronic parts such as integrated circuits, transistors, and diodes. The issues identified and the controls set forth in this practice address the characterization and suitability of the radiation environments. They generally apply to reactor and 14-MeV neutron sources when used for displacement damage testing, and apply to ²⁵² Cf testing when this source is used for this application. Facility and environment characteristics that introduce complications or problems are identified, and recommendations are offered as to how problems can be recognized and minimized or solved. This practice may be used by facility users, test personnel, facility operators, and independent process validators to determine the suitability of a specific environment within a facility and of the testing process as a whole, with the exception of the electrical measurements, which are addressed in other standards. Additional information on conducting irradiations can be found in Practices E 798 and F 1190. This practice also may be of use to test sponsors (that is, organizations that establish test specifications or otherwise have a vested interest in the performance of electronics in neutron environments).

1.3 Methods for evaluation and control of undesired contributors to damage are discussed in this practice, and references to relevant ASTM standards and technical reports are provided. Processes and methods used to arrive at the appropriate test environments and specification levels for electronics systems are beyond the scope of this practice; however, the process for determining the 1-MeV equivalent displacement specifications from operational environment neutron spectra should employ the methods and parameters described herein. Some important considerations are addressed in through (Nonmandatory information)..

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

ASTM Standards

E170 Terminology Relating to Radiation Measurements and Dosimetry

E181 Test Methods for Detector Calibration and Analysis of Radionuclides

E261 Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques

E262 Test Method for Determining Thermal Neutron Reaction Rates and Thermal Neutron Fluence Rates by Radioactivation Techniques

E263 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Iron

E264 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel

E265 Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32

E393 Test Method for Measuring Reaction Rates by Analysis of Barium-140 From Fission Dosimeters

E481 Test Method for Measuring Neutron Fluence Rates by Radioactivation of Cobalt and Silver

E482 Guide for Application of Neutron Transport Methods for Reactor Vessel Surveillance, E706 (IID)

E523 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Copper

E526 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Titanium

E665 Practice for Determining Absorbed Dose Versus Depth in Materials Exposed to the X-Ray Output of Flash X-Ray Machines

E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation

E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

E704 Test Method for Measuring Reaction Rates by Radioactivation of Uranium-238

E705 Test Method for Measuring Reaction Rates by Radioactivation of Neptunium-237

E720 Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics

E721 Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics

E722 Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

E798 Practice for Conducting Irradiations at Accelerator-Based Neutron Sources

E844 Guide for Sensor Set Design and Irradiation for Reactor Surveillance, E 706 (IIC)

E944 Guide for Application of Neutron Spectrum Adjustment Methods in Reactor Surveillance, E 706 (IIA)

E1018 Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E706 (IIB)

E1249 Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

E1250 Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

E1297 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium

E1855 Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

E2005 Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields

F1190 Guide for Neutron Irradiation of Unbiased Electronic Components

Keywords

electronics testing; neutron-induced damage; nuclear test reactors; test consistency ; 1 MeV-equivalence;

ICS Code

ICS Number Code 19.080 (Electrical and electronic testing); 31.020 (Electronic components in general)

DOI: 10.1520/E1854-05

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