ASTM E1161-95
Historical Standard: ASTM E1161-95 Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
SUPERSEDED (see Active link, below)
ASTM E1161
1. Scope
1.1 This test method provides a standard procedure for nondestructive radiographic examination of semiconductor devices, electronic components, and the materials used for construction of these items. This test method covers the radiographic testing of these items for possible defective conditions such as extraneous material within the sealed case, improper internal connections, voids in materials used for element mounting, or the sealing glass, or physical damage.
1.2 The quality level and acceptance criteria for the specimens being tested shall be specified in the detail drawing, purchase order or contract.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
ASTM Standards
E94 Guide for Radiographic Examination
E431 Guide to Interpretation of Radiographs of Semiconductors and Related Devices
E543 Specification for Agencies Performing Nondestructive Testing
E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation
E801 Practice for Controlling Quality of Radiological Examination of Electronic Devices
E999 Guide for Controlling the Quality of Industrial Radiographic Film Processing
E1000 Guide for Radioscopy
E1079 Practice for Calibration of Transmission Densitometers
E1254 Guide for Storage of Radiographs and Unexposed Industrial Radiographic Films
E1255 Practice for Radioscopy
E1316 Terminology for Nondestructive Examinations
E1390 Specification for Illuminators Used for Viewing Industrial Radiographs
E1411 Practice for Qualification of Radioscopic Systems
E1453 Guide for Storage of Magnetic Tape Media that Contains Analog or Digital Radioscopic Data
E1475 Guide for Data Fields for Computerized Transfer of Digital Radiological Examination Data
E1742 Practice for Radiographic Examination
E1815 Test Method for Classification of Film Systems for Industrial Radiography
E1817 Practice for Controlling Quality of Radiological Examination by Using Representative Quality Indicators (RQIs)
E2339 Practice for Digital Imaging and Communication in Nondestructive Evaluation (DICONDE)
E2597 Practice for Manufacturing Characterization of Digital Detector Arrays
ANSI Standards
ANSI/ESDS20.20 ESD Association Standard for the Development of an Electrostatic Discharge Control Program for Protection of Electrical and Electronic Parts, Assemblies and Equipment (Excluding Electrically Initiated Explosive Devices)Keywords
capacitor; diode; electronic device; hybrid; inductor; microcircuits; microcircuit array; monolithic; multichip; nondestructive testing; radiographic; radiologic; radiology; radioscopy; rectifier; relay; resistor; semiconductor; switches; transformer; transistor; tunnel diode; voltage regulator; x-ray; Defects--semiconductors; Electrical conductors (semiconductors); Electronic materials/applications; Radiographic examination; Sealing glass defects; Voids; X-irradiation
ICS Code
ICS Number Code 31.080.01 (Semi-conductor devices in general)
DOI: 10.1520/E1161-95
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